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储能系统技术 储能系统 SiC器件 GaN器件 ★ 4.0

有机缓冲层对不同沟道长度有机晶体管中电荷注入与传输特性的影响

Effect of the Organic Buffer Layer on Charge Injection and Transport Characteristics in Organic Transistors With Different Channel Lengths

作者 Walid Boukhili · Swelm Wageh · Quanhua Chen · Fathi Jomni · Xiang Wan · Zhihao Yu
期刊 IEEE Transactions on Electron Devices
出版日期 2025年7月
技术分类 储能系统技术
技术标签 储能系统 SiC器件 GaN器件
相关度评分 ★★★★ 4.0 / 5.0
关键词 有机晶体管 沟道缩小 有机缓冲层 接触电阻 有机场效应晶体管
语言:

中文摘要

沟道尺寸缩小的研究推动了半导体技术的显著进步,而有机晶体管的尺寸缩减仍需深入理解,尤其是短沟道效应。本文研究了有机缓冲层的引入及沟道长度缩放对接触电阻、电荷传输及器件性能的影响。在源/漏电极与有机半导体间插入有机缓冲层可显著降低接触电阻,并有效改善漏致势垒降低(DIBL)和界面陷阱密度,该效应在短沟道器件中尤为明显,因电极接触在整体电荷传输中起主导作用。本研究为短沟道有机薄膜晶体管的器件物理及未来电子器件发展提供了重要见解。

English Abstract

Extensive research on channel downscaling has led to notable advancements in semiconductor technology. Studying the size reduction of organic transistors remains an important task that necessitates a comprehensive understanding, especially for the short-channel effect. In this work, we investigated the impacts of the insertion of the organic buffer layer and channel length scaling on contact resistance, charge transport, and, consequently, the device performance. Incorporation of an organic buffer layer between the source/drain (S/D) electrodes and the organic semiconductor (OSC) leads to a substantially decreased contact resistance, closely correlated with improved drain-induced barrier lowering (DIBL) and interface trap density. This behavior is especially noticeable in devices with shorter channel lengths, where the contacts play a critical role in the whole charge transport. Our results provide insights into the development of upcoming electronic components, specifically in the field of organic field-effect transistor (OFET) device physics, with short channel lengths.
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SunView 深度解读

该有机晶体管短沟道效应研究对阳光电源功率半导体器件应用具有重要借鉴意义。研究揭示的缓冲层降低接触电阻、改善DIBL效应的机制,可启发SiC/GaN功率器件的界面优化设计。在ST系列储能变流器和SG光伏逆变器中,通过优化功率模块的电极-半导体界面结构,可降低导通电阻和开关损耗,提升器件在高频开关下的可靠性。特别是对三电平拓扑中的高速开关器件,界面接触优化能有效抑制短沟道效应导致的性能退化,为PowerTitan大型储能系统和充电桩产品的功率密度提升及热管理优化提供理论支撑,推动下一代高效功率电子技术发展。