不同功率循环导通模式下商用SiC MOSFET老化前兆与失效机理的对比研究

Power cycling test (PCT) is an effective method to evaluate the SiC mosfets' long-term reliability, including lifetime and degradation mechanisms. Some of the aging precursors of PCT have been identified in the previous literature. But when multiple failure mechanisms compete with each other, the individual precursors are nullified. Although PCT is mainly used to evaluate the package reliability, ...