固态断路器应用中SiC功率模块并联芯片的不稳定性问题

Paralleled dies in a power module could have instability issues during high current switching transients. The instability is caused by the differential-mode oscillation among paralleled MOSFETs. Conventional analyses of paralleled MOSFETs’ stability are normally limited to a single operating point, which ignores the influences of the switching trajectory and nonlinear device parameters on stabilit...