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储能系统技术 储能系统 SiC器件 ★ 4.0

通过等离子体处理实现NiO/β-Ga2O3异质结二极管的自对准氮掺杂

Self-aligned nitrogen doping via plasma treatment of NiO/β-Ga2O3 heterojunction diodes

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中文摘要

摘要:在本研究中,我们展示了一种通过自对准氮(SA-N2)等离子体处理NiO/β-Ga2O3异质结二极管实现的新型掺杂工艺。经SA-N2等离子体处理后的异质结二极管,其击穿电压从1080 V提高至1731 V,同时保持了超过10^11的高开关电流比(ION/IOFF),并实现了降低的比导通电阻(Ron,sp)。研究发现,SA-N2等离子体处理在阳极周围的β-Ga2O3中形成一个具有电阻特性的区域,起到浅层保护环的作用。此外,确认了掺杂的氮在NiO中充当浅受主,而在β-Ga2O3中则充当深能级受主。该工艺可简便且低成本地应用于异质结结构,有助于进一步提升宽禁带功率器件的性能。

English Abstract

Abstract In this work, we demonstrate a novel doping process via self-aligned nitrogen (SA-N 2 ) plasma treatment of the NiO/β-Ga 2 O 3 heterojunction diodes. The SA-N 2 plasma-treated heterojunction diodes exhibit improved breakdown voltage from 1080 V to 1731 V while maintaining a high on–off ratio ( I ON /I OFF ) exceeding 10 11 and achieving a reduced specific on-resistance ( R on.sp ). It is found that the SA-N 2 plasma treatment forms a resistive region acting as a shallow guard ring in the β-Ga 2 O 3 around the anode. It is also confirmed that doped N plays the role of both a shallow acceptor and a deep acceptor in NiO and β-Ga 2 O 3 , respectively. This process can be easily and cost-effectively applied to the heterojunction structure, contributing to further performance improvement of the wide bandgap power device.
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SunView 深度解读

该NiO/β-Ga2O3异质结氮掺杂技术对阳光电源功率器件研发具有重要参考价值。其通过等离子体处理实现耐压提升60%至1731V,同时降低导通电阻,与阳光电源ST系列储能变流器及SG光伏逆变器中的宽禁带器件应用方向高度契合。该自对准掺杂工艺可为公司下一代SiC/GaN器件的边缘终端优化提供新思路,有助于提升PowerTitan等高压储能系统的功率密度和可靠性,推动1500V系统效率突破。