基于结温无关在线状态监测与主动温度频率调节的GaN基开关电源转换器自老化预测

To mitigate unique aging and failure challenges encountered in GaN technology, this article develops the techniques that reinforce the reliability of GaN power circuits. In particular, an online condition monitoring scheme is developed to prognose the current collapse induced aging and failures in GaN power switches, using the devices' dynamic on-resistance rDS_ON, as the real-time precursor. As r...