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铜夹片特性对Dr.MOS封装热性能的影响
Effect of Clip Characteristics on Thermal Performance of Dr.MOS Packages
| 作者 | Hao-Lin Yen · Fang-I Lai |
| 期刊 | IEEE Access |
| 出版日期 | 2025年1月 |
| 技术分类 | 储能系统技术 |
| 技术标签 | 储能系统 可靠性分析 |
| 相关度评分 | ★★★★ 4.0 / 5.0 |
| 关键词 | 铜夹设计 驱动MOSFET封装 散热效率 热阻 热管理效率 |
语言:
中文摘要
研究探讨了铜夹片设计对驱动MOSFET封装热性能的影响,以优化微电子元件的散热效率。实验检验了四个关键变量:夹片厚度、材料、附着材料和镀层材料。结果表明夹片厚度从0.15mm增至0.2mm可使热阻降低2.1%(从3.3667°C/W降至3.2958°C/W)。使用高导热率的C1100铜(391 W/m-K)进一步降低热阻改善整体散热。采用SAC305等高导电粘合剂改善了夹片与晶圆间的热界面,石墨烯涂层增强了热稳定性和耐腐蚀性。在12V和19V高压条件下,较厚铜夹片和更好附着材料的封装显著降低表面温度,在12V下从93.3°C降至71.7°C。
English Abstract
This study explores the impact of copper clip design on the thermal performance of driver MOSFET (Dr.MOS) packages with the goal of optimizing heat dissipation efficiency in microelectronic components. The study examines four key variables: clip thickness, material, attachment material, and plating material. The experimental results show that increasing the clip thickness from 0.15mm to 0.2mm leads to a 2.1% reduction in thermal resistance (from 3.3667°C/W to 3.2958°C/W). Furthermore, using copper C1100, which has higher thermal conductivity (391 W/m-K), further reduces thermal resistance, improving overall heat dissipation. Additionally, employing high-conductivity adhesives like SAC305 improves the thermal interface between the clip and wafer, while coatings such as graphene enhance thermal stability and corrosion resistance. Under high-voltage conditions (12V and 19V), the package with thicker copper clips and better attachment materials exhibited a significant reduction in surface temperature, dropping from 93.3°C to 71.7°C at 12V. These findings offer valuable insights for enhancing the thermal management efficiency of Dr.MOS packages, ensuring better reliability and longevity in high-power applications.
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SunView 深度解读
该Dr.MOS热管理研究对阳光电源功率器件封装优化具有直接指导价值。研究中铜夹片厚度和材料选择对热阻的影响与阳光SiC/GaN功率模块的散热设计高度相关。SAC305焊接工艺和石墨烯涂层技术可应用于阳光ST系列储能变流器和SG系列光伏逆变器的功率模块封装改进,在高电压工况下显著降温的结果为阳光1500V光伏系统和高压储能系统的可靠性提升提供了实验数据支撑。该研究对阳光电源提高功率密度同时保证长期可靠性的产品开发目标有重要参考意义。