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储能系统技术 储能系统 可靠性分析 ★ 4.0

激光束功率对用于MEMS封装的微型LED激光焊点微观结构演变及界面动力学的影响

Effect of laser beam power on microstructure evolution and interface kinetics of laser-soldered mini-LEDs for MEMS packaging

作者 Jun Ho Ku · Sri Harini Rajendran · Ashutosh Sharma · Jae Pil Jung
期刊 Journal of Materials Science: Materials in Electronics
出版日期 2025年1月
卷/期 第 36.0 卷
技术分类 储能系统技术
技术标签 储能系统 可靠性分析
相关度评分 ★★★★ 4.0 / 5.0
关键词 激光焊接 微型LED Sn–3.0Ag–0.5Cu焊膏 金属间化合物 界面反应动力学
语言:

中文摘要

激光焊接通过局部加热和更短的加工时间,相较于微机电系统封装中的回流焊工艺,能够减少热损伤并提高微型LED的连接可靠性。本研究探讨了在激光辅助键合过程中使用第8型(2–8 µm)Sn–3.0Ag–0.5Cu焊膏所形成的微型LED焊点的微观结构、力学性能及老化特性。在激光束功率为47–57 W范围内可实现有效键合,其中Cu6Sn5金属间化合物(IMC)厚度从47 W时的2.2 ± 0.58 μm增加至57 W时的2.6 ± 0.3 μm。在125 °C下进行等温老化后,57 W焊接接头的IMC厚度在400小时后进一步增至4.8 ± 0.15 μm,并伴随微观结构的粗化现象。在52 W功率下焊接的接头表现出最高的初始剪切强度(0.9 ± 0.5 N),但老化后断裂模式发生变化,高功率条件下形成的粗大Ag3Sn相和较厚的Cu6Sn5 IMC导致脆性断裂。这些结果表明,在微型LED封装中需优化激光束功率,以实现机械可靠性和热稳定性的平衡。

English Abstract

Laser soldering offers localized heating and shorter processing times, reducing thermal damage and improving Mini-LED bonding reliability over reflow soldering in microelectromechanical systems packages. This study examines the microstructural, mechanical, and aging properties of Mini-LED joints formed using Type-8 (2–8 µm) Sn–3.0Ag–0.5Cu solder paste in a Laser-Assisted Bonding process. Effective bonding was achieved at laser beam power 47–57 W, with Cu 6 Sn 5 intermetallic compound (IMC) thickness increasing from 2.2 ± 0.58 μm at 47 W to 2.6 ± 0.3 μm at 57 W. Isothermal aging at 125 °C further increased IMC thickness to 4.8 ± 0.15 μm after 400 h for 57 W soldered joints, alongside microstructural coarsening. Joints soldered at 52 W showed the highest initial shear strength (0.9 ± 0.5 N), but aging altered fracture modes, with coarsened Ag 3 Sn and thicker Cu 6 Sn 5 IMCs causing brittle failures at higher power levels. These results highlight the need to optimize laser beam power for balanced mechanical reliability and thermal stability in Mini-LED packaging.
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SunView 深度解读

该激光焊接微结构优化技术对阳光电源功率器件封装具有重要借鉴价值。ST系列储能变流器和SG逆变器中大量使用Mini-LED显示及功率模块,激光焊接可替代传统回流焊,减少热损伤并提升键合可靠性。研究揭示的激光功率-IMC厚度-剪切强度关联机制,可指导SiC/GaN器件封装工艺优化,特别是在125°C高温老化环境下的长期可靠性提升。建议在PowerTitan储能系统和充电桩功率模块封装中,采用52W激光功率参数,平衡机械强度与热稳定性,延长MEMS传感器及显示组件寿命,支撑智慧运维平台的数据采集精度。