h-BN横向器件的输运特性

One of the well-established and significant applications of hexagonal boron nitride (h-BN) is in solid-state neutron detectors, which necessitate the development of quasi-bulk h-BN crystals. To advance the material and device development of h-BN, it is essential to characterize its bulk electrical transport properties. However, this task is challenging due to h-BN's ultrawide bandgap (UWBG) of approximately 6.1 eV, which results in an extremely high electrical resistivity, typically exceeding 1012 Ω⋅cm. On the other hand, the mobility-lifetime (μτ) product, a key figure of merit for determining the overall device performance, is more readily accessible through the characterization of the I-V characteristics under illumination. In this study, we investigate the in-plane μτ products of lateral devices fabricated from freestanding quasi-bulk h-BN wafers synthesized by hydride vapor phase epitaxy. Our results reveal an unexpected decrease in the in-plane μτ product as the device width decr