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硅基氮化镓异质结构的压电特性及其对开关运行寿命的影响

Piezoelectric Properties of GaN-on-Si Heterostructures and Their Implications on Lifetime During Switching Operation

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中文摘要

由于氮化镓(GaN)固有的压电特性,基于该技术的器件在循环开关运行中易产生机电诱导的谐振现象。本文提出了一种对GaN-on-Si测试异质结构的机械谐振进行建模的方法,并评估了谐振情况下应力对器件寿命的影响。

English Abstract

Due to the intrinsic piezoelectric nature of gallium nitride (GaN), devices manufactured with such technology are in principle prone to experience electromechanically induced resonance phenomena during cyclic switching operation. We will outline an approach to model the mechanical resonance in a GaN-on-Si test heterostructure and evaluate the implication of the stresses in the resonance case. A re...
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SunView 深度解读

随着阳光电源在户用光伏逆变器及小型化储能产品中对高功率密度要求的提升,GaN器件的应用潜力巨大。该研究揭示了GaN-on-Si器件在高速开关下的压电效应与机械谐振风险,这对公司研发团队在进行功率模块选型、驱动电路设计及长期可靠性评估时具有重要参考价值。建议在后续高频化逆变器产品开发中,重点关注GaN器件的应力疲劳失效机制,通过优化封装工艺和驱动策略,规避谐振风险,确保产品在全生命周期内的可靠性。