软开关、高频及超高频功率变换器中600V GaN功率半导体的Coss损耗

We report losses from charging and discharging the parasitic output capacitor, ${\rm C}_{\rm OSS}$, in Gallium Nitride (GaN) power devices with voltage ratings over 600 ${\rm V}_{\rm DS}$ . These losses are of particular importance in soft-switched circuits used at MHz switching frequencies, where the output capacitance of the device is charged and discharged once per switching cycle during the d...