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储能系统技术 储能系统 SiC器件 可靠性分析 ★ 5.0

sThing:基于可配置环形振荡器PUF的硬件安全与回收芯片检测新方法

sThing: A Novel Configurable Ring Oscillator Based PUF for Hardware Security and Recycled IC Detection

作者 Saswat Kumar Ram · Sauvagya Ranjan Sahoo · Banee Bandana Das · Kamalakanta Mahapatra · Saraju P. Mohanty
期刊 IEEE Access
出版日期 2025年1月
技术分类 储能系统技术
技术标签 储能系统 SiC器件 可靠性分析
相关度评分 ★★★★★ 5.0 / 5.0
关键词 环形振荡器 物理不可克隆函数 老化传感器 可配置环形振荡器 CMOS技术
语言:

中文摘要

环形振荡器RO广泛用于解决不同硬件安全问题。例如,基于RO的物理不可克隆函数PUF为密码应用生成安全可靠密钥,基于RO的老化传感器用于高效检测回收IC。本文使用带两个电压控制信号的CMOS反相器设计可配置RO(CRO)。通过控制信号,所提CRO可加速和降低老化对振荡频率的影响。CRO的这一关键特性使其适用于PUF和基于RO的传感器。在90nm CMOS工艺中评估所提改进架构即CRO PUF和CRO传感器的性能。CRO的老化容忍特性增强了CRO PUF的可靠性,老化加速特性提升了回收IC检测率。最后,所提架构相比标准架构具有面积和功耗优势。

English Abstract

The ring oscillator (RO) is widely used to address different hardware security issues. For example, the RO-based physical unclonable function (PUF) generates a secure and reliable key for the cryptographic application, and the RO-based aging sensor is used for the efficient detection of recycled ICs. In this paper, a CMOS inverter with two voltage control signals is used to design a configurable RO (CRO). With its control signals, the proposed CRO can both accelerate and lower the impact of aging on the oscillation frequency. This vital feature of the proposed CRO makes it suitable for use in PUFs and RO-based sensors. The performance of both the proposed modified architecture, i.e., CRO PUF and CRO sensor, is evaluated in 90 nm CMOS technology. The aging tolerant feature of the proposed CRO enhances the reliability of CRO PUF. Similarly, the aging acceleration property of CRO improves the rate of detection of recycled ICs. Finally, both the proposed architectures are area and power-efficient compared to standard architectures.
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SunView 深度解读

该物理不可克隆函数技术对阳光电源芯片级安全具有重要意义。阳光储能变流器和光伏逆变器采用大量功率器件和控制芯片,面临芯片回收和仿冒风险。该CRO PUF技术可集成到阳光定制芯片的安全模块,生成唯一硬件指纹用于设备认证和固件加密。在供应链管理中,该老化传感器技术可检测回收功率器件,保证产品质量和可靠性。结合阳光iSolarCloud平台的设备认证系统,该PUF技术可实现芯片级设备身份认证,防止假冒产品接入云平台,保护用户数据安全和品牌声誉,提升整体系统安全等级。