一种用于纳秒脉冲宽度和大功率LIV测试的嵌入式电流传感方法

This letter presents an embedded current sensing (ECS) method to address the critical challenges in light–current–voltage (LIV) testing under nanosecond-pulsewidth and high-peak-power conditions. The conventional LIV testing method is mainly limited by the accuracy of current measurement at high di/dt. The proposed ECS method leverages an innerlayer printed circuit board (PCB) trace coupled with t...