一种用于功率半导体热瞬态测量的稀疏促进时域评估方法

This article investigates evaluation methods of thermal transient measurements to obtain the internal thermal structure of semiconductor devices. First, the study uncovers the limitations of a widely accepted standard method that uses frequency-domain deconvolution. An important finding is that the sideband of the time constant spectrum by the standard method has no physical meaning despite it bee...