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通过应力工程增强柔性AlGaN/GaN高电子迁移率晶体管阵列的电学性能
Enhanced electrical properties of flexible AlGaN/GaN HEMT arrays via stress engineering
| 作者 | Xiu Zhang · Wei Ling · Junchen Liu · Hu Tao · Tao Tang |
| 期刊 | Applied Physics Letters |
| 出版日期 | 2025年1月 |
| 卷/期 | 第 127 卷 第 7 期 |
| 技术分类 | 储能系统技术 |
| 技术标签 | 储能系统 GaN器件 |
| 相关度评分 | ★★★★ 4.0 / 5.0 |
| 关键词 | 宽禁带半导体 柔性AlGaN/GaN HEMT 机械变形 电学性能 应变诱导极化 |
语言:
中文摘要
宽禁带半导体因其优异的电学与机械特性,在柔性电子器件中展现出巨大潜力。本文报道了通过深硅刻蚀和晶圆级衬底转移工艺制备的柔性AlGaN/GaN高电子迁移率晶体管(HEMT)阵列。器件在_VGS_=1 V时实现最高饱和漏极电流密度达166.5 mA/mm,在_VDS_=5 V时峰值跨导为42.6 mS/mm,并表现出良好的抗机械变形能力。此外,在面内拉伸应变下,器件性能进一步提升,归因于应变诱导的压电极化调控AlGaN/GaN异质界面二维电子气密度。该结果凸显HEMT在下一代柔性电子,尤其是生物电子等领域的应用前景。
English Abstract
Wide-bandgap semiconductors, by virtue of their superior electrical and mechanical properties, enable significant performance enhancements in flexible electronics. Here, we report flexible AlGaN/GaN high-electron-mobility transistor (HEMT) arrays fabricated through deep silicon etching and wafer-scale substrate transfer processes. The flexible AlGaN/GaN HEMT devices demonstrate a maximum saturated drain current density of 166.5 mA/mm at _VGS_ = 1 V and a peak transconductance of 42.6 mS/mm at _VDS_ = 5 V, along with notable tolerance to mechanical deformation. Moreover, under in-plane tensile strain, the devices exhibit improved electrical performance. This enhancement is attributed to the modulation of the two-dimensional electron gas density at the AlGaN/GaN heterointerface driven by strain-induced piezoelectric polarization. These favorable characteristics underscore the strong potential of HEMTs for next-generation flexible electronic applications, particularly in fields such as bi
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SunView 深度解读
该柔性GaN HEMT技术对阳光电源功率器件应用具有前瞻价值。研究中应力工程调控二维电子气密度提升器件性能的机制,可为ST系列储能变流器和SG逆变器中GaN器件的封装应力优化提供理论指导,通过合理设计功率模块封装结构实现应变调控以提升开关特性。柔性HEMT阵列的抗机械变形能力对新能源汽车OBC和电机驱动等振动环境应用具有启发意义。此外,应变诱导的压电极化调控机制可用于优化AlGaN/GaN异质结功率器件的栅控特性,提升三电平拓扑中GaN器件的跨导和电流密度,助力功率密度提升和系统小型化。