谐振负载下软硬开关IGBT的功率损耗与电流分布红外热成像研究

A test bench is proposed to study, at die-level, the power losses and current distribution in power devices. It is based on an infrared camera and a flexible half-bridge resonant inverter with a tunable resonance frequency fres. With this setup, the die surface temperature is acquired in steady state, while the device is under real operation. The power losses are derived from the temperature mean ...