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电动汽车驱动 GaN器件 多电平 深度学习 故障诊断 ★ 5.0

基于CGAN视觉Transformer的F型逆变器少样本开路故障诊断

A Few-Shot Open-Circuit Fault Diagnosis of F-Type Inverters Using CGAN-Based Vision Transformer

语言:

中文摘要

多电平逆变器因结构特点广泛应用于各工业领域,但其元件增多导致故障率升高。深度学习模型虽可自动提取特征并实现精确故障诊断,但依赖大量训练样本,而实际工程中故障数据获取困难。为此,本文提出一种融合条件生成对抗网络(CGAN)与视觉Transformer(ViT)的少样本开路故障诊断方法。首先将测量信号转化为时频图像,利用CGAN生成具有相似分布的二维样本图像,再通过改进ViT结合原始与生成样本,采用多头自注意力机制提取局部与全局特征并完成故障分类。在F型逆变器实验平台上验证表明,每类仅用6个样本时,该方法准确率达98.46%,优于传统深度学习方法。

English Abstract

Multilevel inverters (MLIs) are widely adopted in various industries due to their distinctive features. However, they are susceptible to higher failure rates due to the increased number of components. Deep learning (DL) models are widely used for accurately diagnosing faults in inverters because they effectively extract features automatically. These models work on the hypothesis of the availability of a sufficient number of samples to train the diagnostic models. However, obtaining enough sample data in engineering practice is difficult, especially in fault cases. Therefore, this article proposes a fault diagnosis scheme combining a conditional generative adversarial network (CGAN) and a vision transformer (ViT) for diagnosing open-circuit (OC) faults with few fault samples (few shots). First, the measured signals are converted to time–frequency images. Afterward, CGAN generates new 2-D sample images with data distributions similar to real samples. Finally, the improved ViT uses the original and generated samples to learn and extract local and global features with a multihead self-attention mechanism and classify the faults. The proposed scheme is validated using an experimental setup of the F-type inverter, and the results show that the suggested scheme outperforms the other conventional DL methods with an accuracy of 98.46% using only six samples per class.
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SunView 深度解读

该少样本故障诊断技术对阳光电源多电平逆变器产品线具有重要应用价值。针对ST系列储能变流器和SG系列光伏逆变器普遍采用的三电平及多电平拓扑,功率器件数量增多导致开路故障概率上升,而实际运行中故障样本稀缺。该方法通过CGAN数据增强结合ViT特征提取,仅需6个样本即可达98.46%诊断准确率,可直接集成到iSolarCloud智能运维平台,实现储能电站和光伏电站的预测性维护。特别适用于新型SiC/GaN器件应用场景,解决新器件故障数据积累不足问题。该技术还可扩展至电动汽车OBC和充电桩的IGBT模块故障诊断,提升系统可靠性并降低运维成本。