高压宽禁带器件导通电压测量电路拓扑、运行及性能研究

Accurate measurement of on-resistance of semiconductor devices serves as a key indicator of how various stress factors impact the electrical, thermal, and long-term reliability performance of wide bandgap devices. Monitoring on-resistance not only offers technical insight into device physics and degradation mechanisms, but is also used as a diagnostic precursor to device failure and aging. This is...