一种基于变参数功率循环的IGBT高精度低成本疲劳寿命评估方法

Fatigue life of insulated gate bipolar transistor modules (IGBTs) is critical to the reliable application during their long-term servicing. At present, time-consuming and costly power cycling tests are commonly used to obtain the fatigue life model of power electronics devices. In this article, a lower cost and higher efficiency method for the evaluation on the fatigue life of IGBTs was proposed b...