V10：固定暗电流偏置作为光伏组件损伤评估指标

Abstract Rapid, inexpensive, and reliable diagnostic techniques are crucial in the photovoltaic industry at all stages of the module life cycle. Dark current–voltage ( I-V ) is one method used to evaluate module health, allowing for the extraction of key electrical parameters which are influenced by various degradation mechanisms . However, complete dark I-V curves may not be necessary for successful monitoring of certain damage and degradation modes. We propose a new diagnostic technique, named ’V10’, which identifies module damage in the low current regime by monitoring changes in the voltage required to achieve a single specific current injection , offering a more efficient alternative to existing methods. Experiments demonstrate that V10 decreases significantly with module damage, indicating its higher sensitivity to non-visible damage compared to traditional measurements and imaging techniques . In the first experiment’s most damaged condition, V10 decreased by 32.5% while the light I-V P MAX only decreased by 5.4%. Subsequent real-time experiments demonstrate key features of V10 measurements. Requiring minimal power, V10 presents a promising diagnostic tool for detecting damage in modules during laboratory testing, as well as in transportation, installation, commissioning, field monitoring, and re-powering activities.