硅基光伏组件退化及近期识别技术综述

Abstract Photovoltaic (PV) systems have been deployed at an unprecedented rate due to the growing worldwide demand for clean energy. Nevertheless, the most significant challenge is ensuring that these PV systems, particularly the PV modules , function effectively over the long term. This review investigates the degradation of different silicon solar PV technologies , including bifacial cells, focusing on recently introduced technologies such as Tunnel Oxide Passivated Contact (TOPCon) cells and silicon Heterojunction (SHJ) cells. Additionally, it examines recent advancements in failure and degradation identification techniques used in the solar PV industry. Various analytical and experimental studies were reviewed to develop a solid understanding of the approaches used to analyze solar PV degradation, including field monitoring and accelerated aging experiments. Our analysis identifies UV exposure and damp heat as key contributors to module degradation in recently developed PV technologies , such as TOPCon and SHJ. Furthermore, the findings suggest that integrating the scanning I-V curve function into PV inverters and the capability of advanced EL imaging during daylight show significant promise in detecting and quantifying degradation at early stages. A new correlation between environmental factors, such as lightning, and the degradation of PV modules caused by it is discussed. This study provides a comprehensive overview of silicon PV module degradation and diagnostic methods, highlighting the need for greater focus on external factors that accelerate degradation mechanisms . The review also emphasizes the pressing need for more extensive degradation investigations for emerging PV technologies, as current research is limited, and only a few tests have been conducted.