功率循环测试方法对线性损伤累积规则在功率器件寿命估算中适用性的影响

The lifetime of power semiconductor devices, operating under a given mission profile and subjected to power cycling stress, is conventionally estimated under the assumption of linear damage accumulation rule, that is the application of the Miner's rule. To this purpose, lifetime models must be properly defined allowing to take into account for the relevant parameters of power cycling stress. This ...