在高压IGBT特性测试中避免开关损耗低估的脉宽设置研究

This letter highlights the importance of appropriate pulsewidth duration of the double-pulse test for the high-voltage insulated gate bipolar transistor modules, in order to obtain the correct switching characterization and avoid underestimation in losses. Otherwise, it might cause improper design in power converters, especially in their thermal management. It demonstrates how the first on-state p...