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功率器件技术 GaN器件 ★ 5.0

基于Vissenberg-Matters迁移率模型的有机场效应晶体管解析模型

Analytic model for organic field-effect transistors based on Vissenberg-Matters mobility model

语言:

中文摘要

摘要 通过利用泊松方程,有机场效应晶体管(OFET)的基本电流-电压(I–V)公式被重新表述为迁移率函数的双重积分形式。该重构后的I–V公式克服了原始I–V公式中被积函数发散的问题,不仅便于进一步的解析推导,也适用于数值计算。本文提出了一种针对任意幂次的解析二项式展开方法,用于基于Vissenberg-Matters(VM)迁移率模型的OFET模型的解析推导,能够包含由完整的VM模型推导出的所有项。对由四种不同材料制成的六个OFET器件进行的数值计算表明,对于完整模型而言,理论I–V曲线与实验数据之间的吻合程度令人满意;而通常仅考虑VM模型推导的第一项的处理方法,在ID–VD曲线上表现出明显的偏差。因此,在OFET建模中考虑所有项对于确保参数提取的准确性与可靠性至关重要。这些结果对实际应用和器件仿真具有重要意义。

English Abstract

Abstract The fundamental I – V formula of an organic field effect transistor (OFET) is reformulated as double integral of mobility function by using the Poisson’s equation. The reformulated I – V formula overcome the divergence of the integrand in original I – V formula and is convenient not only for further analytic derivations but also for numerical calculations. An analytic binomial expansion for arbitrary power is proposed to analytically derive the OFET model based on Vissenberg-Matters (VM) mobility model being able to consider all terms deduced from the completed VM model. The numerical calculations for six OFET made of four kinds of materials show that the matching degree between theoretical I – V curves and the experimental data is satisfactory for completed model, but evident deviations for I D – V D curves exhibited in usual treatment that only considering first term deduced from the VM model. It is important to consider all terms in modelling OFET to ensure accuracy and reliability for extraction of parameters. These are useful for practical applications and device simulations.
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SunView 深度解读

该有机场效应晶体管解析模型研究对阳光电源功率器件技术具有方法论借鉴价值。文中提出的双重积分重构I-V公式及二项式展开解析方法,可应用于SiC/GaN器件建模优化,提升三电平拓扑中功率开关特性仿真精度。完整模型考虑所有项的思路,对ST储能变流器和SG逆变器中新型半导体器件参数提取、损耗计算及热管理设计具有指导意义,有助于提高系统效率和可靠性预测准确度。