基于主动功率循环和反射测量法的双封装IGBT功率模块键合线损伤检测与SOH估计

High thermal and electrical stress, over a period of time tends to deteriorate the health of power electronic switches. Being a key element in any high-power converter systems, power switches, such as insulated-gate bipolar junction transistors (IGBTs) and metal-oxide semiconductor field-effect transistors, are constantly monitored to predict when and how they might fail. A huge fraction of resear...