栅极-发射极预阈值电压作为高压多芯片IGBT功率模块芯片故障监测的健康敏感参数

This paper proposes a novel health-sensitive parameter, called the gate-emitter pre-threshold voltage VGE(pre-th), for detecting IGBT chip failures in multichip IGBT power modules. The proposed method has been applied in an IGBT gate driver and measures the VGE at a fixed time instant of the VGE transient before the threshold voltage occurs. To validate the proposed method, theoretical analysis an...