高速列车功率IGBT模块剩余使用寿命预测的混合方法

Accurately predicting the remaining useful life (RUL) of power insulated gate bipolar transistor (IGBT) modules is crucial for high-speed trains. Challenges under actual train operations, including significant uncertainty, multivariability, and insufficient full-lifecycle datasets of performance degradation parameters (PDPs), hinder the accurate RUL prediction. Thus, a hybrid RUL prediction approa...