考虑热耦合与不同冷却模式的电容组高分辨率解析热建模方法

Thermal stress is of crucial importance to capacitor reliability. However, for a capacitor bank, on spatial scale, the complex heat transfer modes are not clearly illustrated; and on time scale, the equivalent series resistance (ESR) aging is neither fully discussed in current evaluation methods. These could lead to a glaring error in the prediction of temperature distribution and lifetime estimat...