一种考虑逆变器任务剖面的光伏逆变器功率模块加速老化测试方法

This paper presents a new method for the accelerated aging tests of power semiconductor devices in photovoltaic (PV) inverters. Mission profiles are analyzed; output current and ambient temperature are extracted over several years from multiple PV plants located in France. It is then proposed to create a particular aging profile that takes into account not only the different constraints of the app...