面向任务的参数解耦框架用于持续异常检测

Real-world industrial scenarios have become increasingly dynamic, with new product types, defect patterns, and operational modes emerging rapidly. In such a context, the one-for-more paradigm enables the use of a single model to economically and continually adapt to evolving distributions or patterns, positioning it as a key component in modern Industrial AI systems. This article proposes a novel one-for-more anomaly detection framework designed to identify anomalies across expanding product lines. The framework incorporates two model-agnostic techniques: instance-aware prompt tuning (IPT) and gradient-aware parameter decoupling (GPD). Our approach is built upon a reconstruction-based vision transformer (ViT) encoder–decoder architecture. IPT addresses the domain gap between pretrained models and industrial data by leveraging an instance-level prompt and a shared memory mechanism, which helps the pretrained model retain previously learned patterns. GPD selectively updates network parameters based on the gradient’s impact on prior tasks, employing orthogonal gradient projection to further minimize interference. In addition, we introduce a new dataset to simulate the one-for-more industrial scenario. Extensive experiments on MVTec and our proposed dataset demonstrate that our framework achieves the state-of-the-art performance across various continual learning settings, significantly outperforming existing methods, particularly in multistep incremental scenarios.